Speaker
Shyam Katnagallu
(Max Planck Institut fur Eisenforschung)
Description
Atom probe tomography is now an established near atomic-scale characterization technique. However, the traditional analysis often limits the subtle inherent details of field evaporation processes occurring near defects or multiple phases. We present two cases employing unconventional data mining routines on experimental data to extract valuable physical insights, supported by simulations. First, we utilize the correlations exhibited by field desorption and field evaporation in mass spectra to enable analytical field ion microscopy. Second, the real energy deficit due to defects is resolved from mass spectra using an approach that we term field evaporation energy loss spectroscopy.
Primary author
Shyam Katnagallu
(Max Planck Institut fur Eisenforschung)
Co-authors
Dr
Rousseau Loic
(Groupe de Physique des Matériaux,UMR6634 CNRS, Université de Rouen, 76800 Saint-Etienne du Rouvray, Normandie, France)
Prof.
François Vurpillot
(Groupe de Physique des Matériaux,UMR6634 CNRS, Université de Rouen, 76800 Saint-Etienne du Rouvray, Normandie, France)
Baptiste Gault
(Max-Planck Institut für Eisenforschung)
Dierk Raabe
(Max-Planck Institut für Eisenforschung)
Christoph Freysoldt
(MPI Eisenforschung)
Jörg Neugebauer
